Measurement methodology for vertically aligned nematic reflective displays

Dieter Cuypers; Herbert De Smet; Geert P. S. Van Doorselaer; Jean Van Den Steen; Andre Van Calster

doi:10.1117/12.473849

28 March 2003 Measurement methodology for vertically aligned nematic reflective displays

Dieter Cuypers, Herbert De Smet, Geert P. S. Van Doorselaer, Jean Van Den Steen, Andre Van Calster

Proceedings Volume 5002, Projection Displays IX; (2003) https://doi.org/10.1117/12.473849
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States

Abstract

We developed a measurement method for the characteristics of microdisplays specifically aimed at vertically aligned nematic reflective cells. It allows determination of contrast ratio and cell gap, and gives good estimates for the pretilt angle and the elastic surface-coupling constant. The set-up consists of a laser source, high quality polarisers, a beamsplitter mirror, a quarter-wave plate and a sensitive photodiode. A model for the polarization changes in the light caused by each component allows the extraction of the initial phase retardation induced by the cell and gives a first estimate of the thickness. Simulation of the director configuration in liquid crystals is then used to enhance the accuracy by taking into account the properties of a real LC cell. Matching of the simulation and the measurements yields the required values together with a calibrated simulation model.

Citation Download Citation

Dieter Cuypers, Herbert De Smet, Geert P. S. Van Doorselaer, Jean Van Den Steen, and Andre Van Calster "Measurement methodology for vertically aligned nematic reflective displays", Proc. SPIE 5002, Projection Displays IX, (28 March 2003); https://doi.org/10.1117/12.473849

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