Analysis of system noise in thermal imagers

Kalle Marjanen; Olli P. Yli-Harja

doi:10.1117/12.476786

16 May 2003 Analysis of system noise in thermal imagers

Kalle Marjanen, Olli P. Yli-Harja

Proceedings Volume 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV; (2003) https://doi.org/10.1117/12.476786
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States

Abstract

Two different thermal imagers are tested to find out their system noise properties such as the noise variance, the distribution of the system noise, the effect of the scanning element in the image and the possible uneven distribution of the temperature caused by the optics or other phenomena. The obtained results can be used for comparing the properties of different thermal imagers and in the process of designing optimal image processing algorithms. The system noise estimation is done with three different methods under certain assumptions. These methods are; the use of the two-dimensional autocorrelation-function and the fitted polynomial, the use of suitable high frequencies of the two-dimensional spectrum and the use of stable image series. The first two methods are closely related and can give the noise variance only. The shape of the system noise histogram can be approximated somewhat from the image series under suitable conditions. The variability between the even and the odd lines in image and other, possibly stable phenomena, are also analysed. These methods are first tested with simulated data sets and comparison between the methods is performed. Also real image series from two different cameras are used and conclusions regarding their performance are drawn.

Citation Download Citation

Kalle Marjanen and Olli P. Yli-Harja "Analysis of system noise in thermal imagers", Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, (16 May 2003); https://doi.org/10.1117/12.476786

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