Extraction of the Mueller-Jones part constructed on basis of four anisotropy mechanisms out of experimental deterministic Mueller matrix

Sergey N. Savenkov; Konstantin E. Yushtin

doi:10.1117/12.497157

1 April 2003 Extraction of the Mueller-Jones part constructed on basis of four anisotropy mechanisms out of experimental deterministic Mueller matrix

Sergey N. Savenkov, Konstantin E. Yushtin

Author Affiliations +

Proceedings Volume 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (2003) https://doi.org/10.1117/12.497157
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 2003, 2003, Moscow, Russian Federation

Abstract

It is theoretically known, that there exists a reciprocal correspondence between Mueller and Jones matrix formalisms for deterministic objects. However, in practice, it is mostly failed to determine a Jones matrix corresponding an experimental Mueller matrix of the deterministic object. The reason of such situation is a presence of experimental errors of Mueller matrix measurements. In essence, there is no the systematic study of measurement error influence on results of analysis of information containing in Mueller matrix in polarization literature existed now. In the paper the method of finding of a deterministic Mueller matrix closest (the difference between its element values do not exceed a value of average measurement error) in some sense to initial experimental one is offered and for which the correspondent Jones matrix could be found. Our choice for the deterministic Mueller matrix is based on four anisotropy mechanisms: linear and circular amplitude (dichroism) anisotropy and linear and circular phase (birefrigent) anisotropy.

Citation Download Citation

Sergey N. Savenkov and Konstantin E. Yushtin "Extraction of the Mueller-Jones part constructed on basis of four anisotropy mechanisms out of experimental deterministic Mueller matrix", Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); https://doi.org/10.1117/12.497157

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available