Paper
12 June 2003 Fluorinated materials for 157-nm lithography
Andrew Poss, David Nalewajek, Hari Nair
Author Affiliations +
Abstract
Theoretical absorption spectra at 157 nm for a variety of fluorinated norbornene monomers were calculated by time dependent-density functional theory (TD.DFT). Based on the theoretical spectra, we have prepared a number of fluorinated norbornene monomers via different synthetic routes. Norbornene based fluorinated monomers were readily prepared from commercially available starting materials in good yields.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew Poss, David Nalewajek, and Hari Nair "Fluorinated materials for 157-nm lithography", Proc. SPIE 5039, Advances in Resist Technology and Processing XX, (12 June 2003); https://doi.org/10.1117/12.485088
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Cited by 1 scholarly publication.
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KEYWORDS
Fluorine

Carbon monoxide

Absorption

Lithography

Ultraviolet radiation

Patents

Photoresist materials

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