Paper
26 June 2003 Optical lithography at half the Rayleigh resolution limit by two-photon absorption resist
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Abstract
Recently, it has shown that Rayleigh diffraction limit (a size λ/2) is overcome using entangled-photon pairs, where λ is the optical wavelength. However, the intensity of the entangled-photon pairs generated from optical parametric down-conversion are so weak that it is not enough to attain the practical throughput. We propose a new method which enables to enhance the resolution over the Rayleigh limit with coherent laser light by using polarization-dependent two-photon absorption resist.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiromi Ezaki and Masato Shibuya "Optical lithography at half the Rayleigh resolution limit by two-photon absorption resist", Proc. SPIE 5040, Optical Microlithography XVI, (26 June 2003); https://doi.org/10.1117/12.485500
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KEYWORDS
Absorption

Polarization

Super resolution

Photon polarization

Optical lithography

Diffraction

Beam splitters

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