AFM/MFM hybrid nanocharacterization of martensitic transformation and degradation for Fe-Pd shape memory alloy

Takayuki Suzuki; Kohei Nagatani; Kazumi Hirano; Tokuo Teramoto; Minoru Taya

doi:10.1117/12.484274

22 July 2003 AFM/MFM hybrid nanocharacterization of martensitic transformation and degradation for Fe-Pd shape memory alloy

Takayuki Suzuki, Kohei Nagatani, Kazumi Hirano, Tokuo Teramoto, Minoru Taya

Author Affiliations +

Proceedings Volume 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems; (2003) https://doi.org/10.1117/12.484274
Event: NDE for Health Monitoring and Diagnostics, 2003, San Diego, California, United States

Abstract

Martensitic transformation and degradation characteristics for Fe-Pd ferromagnetic shape memory alloy were investigated by the developed AFM (Atomic Force Microscope)/MFM (Magnetic Force Microscope) hybrid nano-characterization technique. In AFM martensitic transformation was detected by the changes of surface topography of martensite plates. In MFM martensitic transformation was detected by the changes of magnetic domain structures. This technique has an advantage that martensitic transformation characteristics such as martensitic transformation temperature and reverse transformation temperature can be measured at microscopic and nanoscopic small area. Degradation characteristics of martensitic transformation under cyclic loading were also detected by the changes of AFM and MFM images. In AFM images surface topography of martensite plates became flat and in MFM images the morphology of magnetic domain structures became unfocused under cyclic loading. Then it was found that the hybrid nano-characterization was very high sensitive technique to evaluate degradation for Fe-Pd ferromagnetic shape memory alloy.

Citation Download Citation

Takayuki Suzuki, Kohei Nagatani, Kazumi Hirano, Tokuo Teramoto, and Minoru Taya "AFM/MFM hybrid nanocharacterization of martensitic transformation and degradation for Fe-Pd shape memory alloy", Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003); https://doi.org/10.1117/12.484274

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