Paper
22 July 2003 Cylindrical polarization symmetry for nondestructive nanocharacterization
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Abstract
Recently there is an increasing interest in laser beams with radial symmetry in polarization. Due to the cylindrical symmetry in polarization, these beams have unique focusing properties, which may find wide applications in a variety of nanometer scale applications, including high-resolution metrology, high-density data storage, and multi-functional optical microtool. In this paper, simple method of generating cylindrically polarized beams is presented and their potential applications to nondestructive nano-characterization are discussed. A high resolution surface plasmon microscope and a surface plasmon enhanced apertureless near-field scanning optical microscope are proposed. An automatic scanning microellipsometer that uses the cylindrical symmetry to enhance the signal-to-noise-ratio in high-spatial-resolution ellipsometric measurement will also be presented.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qiwen Zhan "Cylindrical polarization symmetry for nondestructive nanocharacterization", Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003); https://doi.org/10.1117/12.497948
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Cited by 1 scholarly publication.
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KEYWORDS
Polarization

Surface plasmons

Near field scanning optical microscopy

Microscopes

Nondestructive evaluation

Near field optics

Solids

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