Translator Disclaimer
22 July 2003 International center for nano-materials reliability
Author Affiliations +
Over the last two centuries, engineers have learned how to determine material parameters that describe the properties of construction materials and the behavior of the materials under loading conditions. These parameters are measured from small specimens that are exposed to specific laboratory test conditions, sometimes far away from the real loading conditions for the materials in use. Engineering experience is required to use these material parameters for design and to guarantee material lifetimes of several decades for complex structures and systems, like for example, aircraft. Nano-structures having completely different chemical and physical property behavior than large scale devices possess, due to the extremely large surface to volume ratio along with quantum mechanical effects. Due to cost constraints and the speed of invention and business, there will not be unlimited time as in the past to create the necessary materials testing and characterization procedures and to develop the criteria for design and construction that guarantees reliability and a long lifetime for these new materials. A concept for an international scientist's network concerning characterization modeling and reliability of micro and nano materials will be presented. Objectives for the network are to assure safety and reliability of future products, to develop and harmonize noninvasive testing procedures, to develop training programs for nano characterization and modeling specialists, and for instance, to accelerate the process of application of nano materials.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norbert Meyendorf and Bernd Michel "International center for nano-materials reliability", Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003);


Nanomanufacturing-related programs at NSF
Proceedings of SPIE (August 20 2015)
Security assurances for intelligent complex systems
Proceedings of SPIE (April 30 2007)
Fuzzy logic and manufacturing science
Proceedings of SPIE (June 13 1995)
Qualification of COTS optocoupler
Proceedings of SPIE (July 26 1999)

Back to Top