Translator Disclaimer
22 July 2003 Nanoacoustics: probing acoustic waves on the nanoscale
Author Affiliations +
Two scanning acoustic probe microscopy (SAPM) techniques have been developed for the nanoscale analysis of the interaction of acoustic modes on the surface of a solid. The scanning acoustic force microscope (SAFM) and the scanning acoustic tunneling microscope (SATM) are extensions to the scanning probe microscopy world utilizing the non-linearity of the respective interaction-distance curves in order to detect high-frequency signals, like acoustic waves or electric fields. SAFM and SATM measurements are presented that give an overview of past and present work in this field. With SAPM, acoustic wave properties of arbitrarily polarized surface acoustic wave (SAW) modes can be measured with sub-wavelength resolution and unmatched amplitude sensitivity. SAW dispersion measurements, scattering and diffraction, SAW transducer studies, studies of the crystal anisotropy, as well as atomically resolved images of the oscillating lattice will be discussed.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thorsten Hesjedal "Nanoacoustics: probing acoustic waves on the nanoscale", Proc. SPIE 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems, (22 July 2003);


Optical computer for an acoustic microscope
Proceedings of SPIE (February 05 1996)
Intense acoustic beams for photonic modulation
Proceedings of SPIE (September 15 2004)
Heads for acoustic microscopy and laser optoacoustics
Proceedings of SPIE (March 04 1999)
Thermal Wave Imaging
Proceedings of SPIE (December 10 1986)

Back to Top