Paper
1 August 2003 A classifier design method based on the invariance properties of the Bhattacharyya distance functional
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Abstract
The Bhattacharyya distance functional invariance classifier design method (BDFICDM) reaches an excellent tradeoff between the accuracy performance of nearly 100% and the time performance as much as there is available computational resources for parallelism. A serial implementation of the method is applied to an image composed of two synthetic and two Bradatz textures preserving its characteristics of being highly suitable to a parallel implementation. This implementation characterizes the pattern by composing independent cells of magnitudes evaluated through the interaction of spatially distributed elementary piece of information (EPI) using the Bhatacharyya distance similarity measure. The localized representation, EPI is composed of shifted frames sampled by a sequential process over a direction in order to preserve the pattern topological information. The representational extension of the functional pattern representation is its reduction focusing only on those EPI best candidates for generating invariance locations and using the graph structures for their representation. The BDF sample is classified within a Bayesian approach by comparing it to only those reduced pattern states of invariance, decreasing abruptly the number of needed interactions and comparisons. The procedure comprises the multiple frame, resolution, hypothesis and class approaches and the image representation used as input in the training and classification processes at the frame decomposition instance, is reduced through the use of the KL transform.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emerson Prado Lopes "A classifier design method based on the invariance properties of the Bhattacharyya distance functional", Proc. SPIE 5049, Smart Structures and Materials 2003: Modeling, Signal Processing, and Control, (1 August 2003); https://doi.org/10.1117/12.482846
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KEYWORDS
Image classification

Image processing

Image resolution

Signal processing

Distance measurement

Spatial resolution

Visualization

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