Optical density curve model for CD-R dye coating

Hongda Yue; Longfa Pan; Yuejing Bin; Ken Chen

doi:10.1117/12.510114

9 April 2003 Optical density curve model for CD-R dye coating

Hongda Yue, Longfa Pan, Yuejing Bin, Ken Chen

Proceedings Volume 5060, Sixth International Symposium on Optical Storage (ISOS 2002); (2003) https://doi.org/10.1117/12.510114
Event: Sixth International Symposium on Optical Storage (ISOS 2002), 2002, Wuhan, China

Abstract

The dye coating is the most important process in CD-R replication technique, because the coating result has a significant effect on the final disc quality. Optical density (OD) curve represents the result of dye coating. In this paper an optical density curve model for dye coating is discussed. It can be used as an analysis tool of many important parameters in the coating process, thereby control the disc quality. The optical density curve of the disc after coating is measured with the Dr Schenk and then divided into several sections to line-fitting. The new curve has 4 characteristic points and 3 characteristic line sections, which can be used to make process analysis.

Citation Download Citation

Hongda Yue, Longfa Pan, Yuejing Bin, and Ken Chen "Optical density curve model for CD-R dye coating", Proc. SPIE 5060, Sixth International Symposium on Optical Storage (ISOS 2002), (9 April 2003); https://doi.org/10.1117/12.510114

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KEYWORDS

Coating

Absorbance

Process modeling

Process control

Particles

Optical storage

Optical tracking

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