Paper
14 October 2003 Spectral element method: application to structural damage identification
Usik Lee, Hyeong-Seon Yoo
Author Affiliations +
Proceedings Volume 5062, Smart Materials, Structures, and Systems; (2003) https://doi.org/10.1117/12.514713
Event: Smart Materials, Structures, and Systems, 2002, Bangalore, India
Abstract
This paper introduces a spectral element model-based frequency-domain method of structural damage identification. The appealing features of the present damage identification method are: (1) it requires only the frequency response functions experimentally measured from damaged structure as the input data, and (2) it can locate and quantify many local damages at the same time. The feasibility of the present damage identification method is tested through some numerically simulated damage identification analyses and then experimental verification is conducted for a cantilevered beam with damage caused by introducing three slots.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Usik Lee and Hyeong-Seon Yoo "Spectral element method: application to structural damage identification", Proc. SPIE 5062, Smart Materials, Structures, and Systems, (14 October 2003); https://doi.org/10.1117/12.514713
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KEYWORDS
Chemical elements

Finite element methods

Scanning electron microscopy

Americium

Matrices

Spectral models

Computer simulations

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