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1 April 2003 Nephelometer for determination of the Mueller matrix optical properties of objects
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Abstract
A laser nephelometer for determination of Mueller matrices of the optical properties of objects transforming radiation has been designed. The nephelometer scheme and operation method are described. There have been derived formulas for matrix elements calculation with operating of the nephelometer designed. The polarization characteristics of the probing radiation in the nephelometer are changed by different setting of the first waveplate retarder, and the polarization analysis of the scattered light is carried out with the use of the Fourier expansion of the signal recorded by a photodetector in the process of rotation of the second retardation waveplate retarder placed in front of an immovable analyzer. The absolute error of the Mueller matrix elements measurement have been determined experimentally.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Viacheslav A. Dlugunovich, L. N. Nasennik, Valerii N. Snopko, and Aleh V. Tsaruk "Nephelometer for determination of the Mueller matrix optical properties of objects", Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, (1 April 2003); https://doi.org/10.1117/12.501413
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