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1 April 2003 Fiber optic infrared measurement system for thermal measurement of a Kapton HN sample
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Abstract
A dual-waveband, fiber-optic/infrared (F-O/IR) temperature measurement system was enhanced with incorporated optical chopping and applied to measure the surface temperature of a coated (aluminized) Kapton HN sample. The F-O/IR system provides a non-contact means for accurate membrane temperature measurement without distorting surface contour. An FTIR spectrometer was used to measure the absorptance and reflectance properties of the Kapton HN sample. A long-wave IR scanner was used to validate and enhance results obtained from the spectrometer and predict temperature dependence of optical properties. Data are presented that demonstrate the feasibility to apply the F-O/IR system for non-contact temperature measurement of highly reflective surfaces at low temperatures.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matthew J. Rowley, Danielle N. Rockwood, and Jonathan J. Miles "Fiber optic infrared measurement system for thermal measurement of a Kapton HN sample", Proc. SPIE 5073, Thermosense XXV, (1 April 2003); https://doi.org/10.1117/12.490003
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