SIRTF Telescope Engineering And Trade Studies

R. J. Serviss; R. F. Pelzmann; P. R. Callary

doi:10.1117/12.944973

1 February 1985 SIRTF Telescope Engineering And Trade Studies

R. J. Serviss, R. F. Pelzmann, P. R. Callary

Proceedings Volume 0509, Cryogenic Optical Systems and Instruments I; (1985) https://doi.org/10.1117/12.944973
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

This paper summarizes some of the basic system trade studies of the Space Infrared Telescope Facility (SIRTF) telescope. The basic requirements of the telescope are that it be background limited and have diffraction-limited imaging capability. This background limit is calculated as a function of wavelength in the 100- to 800- μm region and has been done versus primary mirror temperature. It is shown in the first section of this paper that the optics temperature must be less than 8 K. The contribution to the focal plane background by the other elements of the optical system have also been analyzed; this was done to enable determination of what effect the other parameters, e.g., temperatures and scattering properties of the sunshade, baffles, and other critical structures, have on the background noise. The noise generated by scanning the image motion compensation (IMC) systems is also discussed. This noise is generated by the effects of temperature and emissivity variations on the surfaces of the various optical elements. This paper also discusses the selection of materials usable for the primary mirror of cold optics systems. Fused silica is a particularly viable material for this type of system. Finally, there is a discussion on the fine guidance sensor (FGS) and its influence on the design of the telescope, including the optical system, the focal plane, and the potential heat load the focal plane may present to the system. The various locations of the FGS, both external and internal, are examined.

Citation Download Citation

R. J. Serviss, R. F. Pelzmann, and P. R. Callary "SIRTF Telescope Engineering And Trade Studies", Proc. SPIE 0509, Cryogenic Optical Systems and Instruments I, (1 February 1985); https://doi.org/10.1117/12.944973

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available