Paper
16 May 2003 Frequency noise in 850-nm oxidized VCSELs
Jean-Philippe Tourrenc, Philippe Signoret, Mikhael Myara, Francesco Marin, Kent D. Choquette, Robert M. Alabedra
Author Affiliations +
Proceedings Volume 5111, Fluctuations and Noise in Photonics and Quantum Optics; (2003) https://doi.org/10.1117/12.500512
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
Abstract
The spectral purity of laser radiation is a key point in the performance of coherent optical network. As 850nm VCSELs are being used in short distance interconnections, the evaluation of the frequency noise level is essential. Using a Fabry-Perot cavity as a frequency discriminator, the frequency noise spectrum is being investigated in the medium frequency and high frequency range (up to 1GHz). Frequency noise spectra show a 1/fn part in the medium frequency domain and a traditional white noise part in the high frequency domain. The aim of this paper is to present our measurements concerning 850nm-selectively-oxidized VCSELs and to investigate the different factors which have a quantitative influence on the frequency noise spectrum.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean-Philippe Tourrenc, Philippe Signoret, Mikhael Myara, Francesco Marin, Kent D. Choquette, and Robert M. Alabedra "Frequency noise in 850-nm oxidized VCSELs", Proc. SPIE 5111, Fluctuations and Noise in Photonics and Quantum Optics, (16 May 2003); https://doi.org/10.1117/12.500512
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Vertical cavity surface emitting lasers

Resistance

Laser damage threshold

Oxides

Photodiodes

Resonators

Semiconductor lasers

Back to Top