Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025

Matteo Valenza; Alain Hoffmann; Frederic Martinez; A. Laigle; Joseph Rhayem; R. Gillon; Marnix Tack

doi:10.1117/12.497578

12 May 2003 Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025

Matteo Valenza, Alain Hoffmann, Frederic Martinez, A. Laigle, Joseph Rhayem, R. Gillon, Marnix Tack

Author Affiliations +

Proceedings Volume 5113, Noise in Devices and Circuits; (2003) https://doi.org/10.1117/12.497578
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States

Abstract

Three standard 1/f noise models for MOSFETs are actually implemented in software packages: SPICE, HSPICE and recently BSIM3v3l. The aim of this paper is to show the limitation of each of these implementations by comparison between noise simulations and noise measured data. We demonstrated that 1/f noise model implemented in SPICE and HSPICE can not predict correctly noise in all operating regimes which limit their usefulness for design purposes. We show that BSIM3v3 allows the better fitting with experimental noise results in all operating regimes.

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Matteo Valenza, Alain Hoffmann, Frederic Martinez, A. Laigle, Joseph Rhayem, R. Gillon, and Marnix Tack "Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025", Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); https://doi.org/10.1117/12.497578

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