Currently two very interesting trends in design of optical receivers can be observed. The first is to realize optical receivers in deep-sub-μm CMOS technology and to integrate them in analog-digital systems-on-a-chip (SoC). The second even much more innovative trend is to integrate voltage-up-converters (VUCs) in optoelectronic integrated circuits (OEICs) to increase the bandwidth and data rate, whereby only the chip voltage supply is necessary. The properties of deep-sub-µm CMOS optical receivers and of sub-μm OEICs with respect to current consumption, noise, and chip area will be compared. For both trends a new design each and measured results will be presented. The first example is a burst-mode receiver in digital 0.18μm CMOS technology with sensitivities better than -28 dBm and -22 dBm at data rates of 622Mb/s and 1.25Gb/s, respectively, for a bit error rate of 10-10 each. These values compare to sensitivities of -24.5 dBm and -24.1 dBm, respectively, of a 0.6μm BiCMOS OEIC. For implementation of the burst-mode receiver in an analog-digital SoC, a differential circuit is chosen. Another example is an OEIC in 0.6μm BiCMOS technology with an integrated VUC, which generates a bias voltage of 16V for the integrated photodiode from the chip supply voltage of 5V. Due to the VUC, the data rate for the given technology is increased from 50Mb/s to 1.5Gb/s. The dependence of the receiver sensitivity and of the maximum photocurrent on the VUC clock-frequency will be shown. The VUC-OEIC represents a complete SoC consisting of sensor, analog and digital part. Aspects of substrate noise coupling from the digital part into the photodiode and amplifier are discussed.