Near-field imaging of out-of-plane light scattering in photonic crystal slabs

Valentyn S. Volkov; Sergey I. Bozhevolnyi; Dirk Taillaert

doi:10.1117/12.498756

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29 April 2003 Near-field imaging of out-of-plane light scattering in photonic crystal slabs

Valentyn S. Volkov, Sergey I. Bozhevolnyi, Dirk Taillaert

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Proceedings Volume 5118, Nanotechnology; (2003) https://doi.org/10.1117/12.498756
Event: Microtechnologies for the New Millennium 2003, 2003, Maspalomas, Gran Canaria, Canary Islands, Spain

Abstract

A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

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Valentyn S. Volkov, Sergey I. Bozhevolnyi, and Dirk Taillaert "Near-field imaging of out-of-plane light scattering in photonic crystal slabs", Proc. SPIE 5118, Nanotechnology, (29 April 2003); https://doi.org/10.1117/12.498756

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