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22 September 2003 Silicon katarometer with the BSC-type contacts
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Proceedings Volume 5124, Optoelectronic and Electronic Sensors V; (2003)
Event: Optoelectronic and Electronic Sensors V, 2002, Rzeszow, Poland
Thermal conductivity detector (TCD, katarometer) silicon chip was designed with the BSC type (Back Side Contact) electrical contacts, covered by the Cr/Au layer. Detector consists of the two elements - glass plate and silicon chip. There are two flow channels formed at the glass-silicon interface - one for detection and the other for reference. Two highly symmetrical groups of resistors were aligned with the channels and, in the last stage of the fabrication sequence, released from the silicon substrate. Some of these resistors act as the heaters, the other ones as the detectors (thermoresistors) to detect changes of the flowing gas temperature. Tubing - gas inlets and outlets - was positioned at the detector edge, in the Si-glass interface plane. BSC-type electrical contacts application enabled very convenient bonding pads location. The Contacts formation process was optimized and integrated with the other technological steps.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jan M. Lysko, Joanna Lozinko, Jerzy Jazwinski, Bogdan Latecki, Andrzej Panas, and Marianna Gorska "Silicon katarometer with the BSC-type contacts", Proc. SPIE 5124, Optoelectronic and Electronic Sensors V, (22 September 2003);

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