Statistical characterization of speckle noise in coherent imaging systems

Leonid Yaroslavsky; A. Shefler

doi:10.1117/12.502054

30 May 2003 Statistical characterization of speckle noise in coherent imaging systems

Leonid Yaroslavsky, A. Shefler

Proceedings Volume 5144, Optical Measurement Systems for Industrial Inspection III; (2003) https://doi.org/10.1117/12.502054
Event: Optical Metrology, 2003, Munich, Germany

Abstract

Speckle noise imposes fundamental limitation on image quality in coherent radiation based imaging and optical metrology systems. Speckle noise phenomena are associated with properties of objects to diffusely scatter irradiation and with the fact that in recording the wave field, a number of signal distortions inevitably occur due to technical limitations inherent to hologram sensors. The statistical theory of speckle noise was developed with regard to only limited resolving power of coherent imaging devices. It is valid only asymptotically as much as the central limit theorem of the probability theory can be applied. In applications this assumption is not always applicable. Moreover, in treating speckle noise problem one should also consider other sources of the hologram deterioration. In the paper, statistical properties of speckle due to the limitation of hologram size, dynamic range and hologram signal quantization are studied by Monte-Carlo simulation for holograms recorded in near and far diffraction zones. The simulation experiments have shown that, for limited resolving power of the imaging system, widely accepted opinion that speckle contrast is equal to one holds only for rather severe level of the hologram size limitation. For moderate limitations, speckle contrast changes gradually from zero for no limitation to one for limitation to less than about 20% of hologram size. The results obtained for the limitation of the hologram sensor’s dynamic range and hologram signal quantization reveal that speckle noise due to these hologram signal distortions is not multiplicative and is directly associated with the severity of the limitation and quantization. On the base of the simulation results, analytical models are suggested.

Citation Download Citation

Leonid Yaroslavsky and A. Shefler "Statistical characterization of speckle noise in coherent imaging systems", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.502054

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available