Correlated photon metrology of detectors and sources

Jessica Y. Cheung; Martin P. Vaughan; John R. Mountford; Christopher J. Chunnilall

doi:10.1117/12.511956

3 February 2004 Correlated photon metrology of detectors and sources

Jessica Y. Cheung, Martin P. Vaughan, John R. Mountford, Christopher J. Chunnilall

Proceedings Volume 5161, Quantum Communications and Quantum Imaging; (2004) https://doi.org/10.1117/12.511956
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Many of the schemes under study for Quantum Information Processing technology based on photon states involve active and passive optical components as well as detectors. In order to able to establish fidelity levels for these schemes, the performance of the optical components and the quantum efficiency (q.e.) of the detectors require careful and accurate characterization. Correlated photons produced from spontaneous parametric downconversion, which are also the basis of entangled photon states, conveniently offer a direct means of measuring detector q.e. in the photon counting regime, while stimulated parametric downconversion can be used to measure source radiance. Detector and source calibration using correlated photon techniques therefore address some of the key issues critical to the development of QIP technology and the development of correlated/entangled photon metrology. This paper reports work being undertaken at NPL to establish the accuracy limitations of these correlated photon techniques. Significant sources of uncertainty are the need to measure losses due to any optical components used and the requirement to obtain and maintain good geometrical and spectral alignment.

Citation Download Citation

Jessica Y. Cheung, Martin P. Vaughan, John R. Mountford, and Christopher J. Chunnilall "Correlated photon metrology of detectors and sources", Proc. SPIE 5161, Quantum Communications and Quantum Imaging, (3 February 2004); https://doi.org/10.1117/12.511956

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