Production and calibration of the first HEFT hard x-ray optics module

Jason E. Koglin; C. M. Hubert Chen; James Chonko; Finn E. Christensen; William W. Craig; Todd R. Decker; Kurt S. Gunderson; Charles J. Hailey; Fiona A. Harrison; Carsten P. Jensen; Kristin K. Madsen; Marcela Stern; David L. Windt; Haitao Yu; Eric Ziegler

doi:10.1117/12.506431

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29 January 2004 Production and calibration of the first HEFT hard x-ray optics module

Jason E. Koglin, C. M. Hubert Chen, James Chonko, Finn E. Christensen, William W. Craig, Todd R. Decker, Kurt S. Gunderson, Charles J. Hailey, Fiona A. Harrison, Carsten P. Jensen, Kristin K. Madsen, Marcela Stern, David L. Windt, Haitao Yu, Eric Ziegler

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Proceedings Volume 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy; (2004) https://doi.org/10.1117/12.506431
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Complete hard X-ray optics modules are currently being produced for the High Energy Focusing Telescope (HEFT), a balloon born mission that will observe a wide range of objects including young supernova remnants, active galactic nuclei, and galaxy clusters at energies between 20 and 70 keV. Large collecting areas are achieved by tightly nesting layers of grazing incidence mirrors in a conic approximation Wolter-I design. The segmented layers are made of thermally-formed glass substrates coated with depth-graded multilayer films for enhanced reflectivity. Our novel mounting technique involves constraining these mirror segments to successive layers of precisely machined graphite spacers. We report the production and calibration of the first HEFT optics module.

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Jason E. Koglin, C. M. Hubert Chen, James Chonko, Finn E. Christensen, William W. Craig, Todd R. Decker, Kurt S. Gunderson, Charles J. Hailey, Fiona A. Harrison, Carsten P. Jensen, Kristin K. Madsen, Marcela Stern, David L. Windt, Haitao Yu, and Eric Ziegler "Production and calibration of the first HEFT hard x-ray optics module", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); https://doi.org/10.1117/12.506431

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