Paper
29 January 2004 X-ray performance of gratings in the extreme off-plane mount
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Abstract
High groove density reflection gratings placed at grazing incidence in the extreme off-plane mount offer increased performance over conventional in-plane mounts in the x-ray. We present initial off-plane efficiency test results from the grating evaluation facility at the University of Colorado. The test gratings are holographically ruled, ion-etched gratings with radial groove profiles that were developed and fabricated by Jobin-Yvon Inc.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Randall Lee McEntaffer, Steve N. Osterman, Webster C. Cash, John Gilchrist, Jean Flamand, Bruno Touzet, Fransis Bonnemason, and Christian Brach "X-ray performance of gratings in the extreme off-plane mount", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); https://doi.org/10.1117/12.506200
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Cited by 29 scholarly publications.
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KEYWORDS
Diffraction gratings

Sensors

Holography

Diffraction

X-rays

Monochromators

Grazing incidence

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