Advances in polarization metrology

Russell A. Chipman

doi:10.1117/12.511279

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6 November 2003 Advances in polarization metrology

Russell A. Chipman

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Proceedings Volume 5174, Novel Optical Systems Design and Optimization VI; (2003) https://doi.org/10.1117/12.511279
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona’s Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.

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Russell A. Chipman "Advances in polarization metrology", Proc. SPIE 5174, Novel Optical Systems Design and Optimization VI, (6 November 2003); https://doi.org/10.1117/12.511279

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