Polishing robot based on FJP with in situ monitoring system

Hedser van Brug; Michiel Dorrepaal; Ian Saunders

doi:10.1117/12.504739

22 December 2003 Polishing robot based on FJP with in situ monitoring system

Hedser van Brug, Michiel Dorrepaal, Ian Saunders

Proceedings Volume 5180, Optical Manufacturing and Testing V; (2003) https://doi.org/10.1117/12.504739
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

A polishing robot, using the fluid jet polishing technique (FJP), in combination with in-situ monitoring systems will be presented. One of the monitoring systems is used to check the surface roughness, while the other checks the local removal. Owing to this removal monitoring system the presented system is ideally suited for corrective polishing applications where normally a time consuming iterative approach would be required.

Citation Download Citation

Hedser van Brug, Michiel Dorrepaal, and Ian Saunders "Polishing robot based on FJP with in situ monitoring system", Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); https://doi.org/10.1117/12.504739

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