Shape measurement of complex objects using connection techniques based on overlapping areas

Haitao He; Mingyi Chen; Hongwei Guo

doi:10.1117/12.505382

22 December 2003 Shape measurement of complex objects using connection techniques based on overlapping areas

Haitao He, Mingyi Chen, Hongwei Guo

Proceedings Volume 5180, Optical Manufacturing and Testing V; (2003) https://doi.org/10.1117/12.505382
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

In optical three-dimensional measurement, fringe projection technique has found more and more applications. However, in 3D measurement of complex objects, due to the inherent limitation of triangulation, occultation is unavoidable. Meanwhile, the surface of the measured object usually contains discontinuities or the object profile is often sharply steep. Another problem is that for the measurement of a surface with complex reflectivity or quasi-specular, the resulting phase values are unreliable. Therefore, there must be some invalid areas caused by shadow, phase errors or discontinuities, etc. in just a single-view. For compensating the lacked 3-D coordinates of the points in the areas, the multi-frequency fringe projection method is used and temporal phase unwrapping is applied. Invalid areas are marked and further cancelled according to the modulation and phase fitting reliability. To obtain the whole 3D world coordinates of the measured object, a novel connection method based on the principle of the virtual cylinder is presented to accurately integrate the 3D coordinates of every single-view into a global coordinate system. The connection method derives from a technique named Multi-view (aperture) Overlap-scanning Technique (MAOST) based on overlapping areas. The measurement results of an automobile headlamp reflector are experimentally presented to demonstrate the validity.

Citation Download Citation

Haitao He, Mingyi Chen, and Hongwei Guo "Shape measurement of complex objects using connection techniques based on overlapping areas", Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); https://doi.org/10.1117/12.505382

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