Automatic high-precision calibration system for angle encoder (II)

Tsukasa Watanabe; Hiroyuki Fujimoto; Kan Nakayama; Tadashi Masuda; Makoto Kajitani

doi:10.1117/12.506473

20 November 2003 Automatic high-precision calibration system for angle encoder (II)

Tsukasa Watanabe, Hiroyuki Fujimoto, Kan Nakayama, Tadashi Masuda, Makoto Kajitani

Proceedings Volume 5190, Recent Developments in Traceable Dimensional Measurements II; (2003) https://doi.org/10.1117/12.506473
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

This paper describes the automatic calibration system for an angle encode which is installed at the AIST (National Institute of Advanced Industrial Science and Technology). The system uses the Equal-Division-Averaged (EDA) method that is one kind of the self-checking method. This system has great performance of the calibration with small uncertainty. In this paper we try to explain the factor of uncertainty of this system. The dominant uncertainty factor is the eccentricity of shaft between the system and an external rotary encoder. The influence from other factors is very small about 0.01" or less.

Citation Download Citation

Tsukasa Watanabe, Hiroyuki Fujimoto, Kan Nakayama, Tadashi Masuda, and Makoto Kajitani "Automatic high-precision calibration system for angle encoder (II)", Proc. SPIE 5190, Recent Developments in Traceable Dimensional Measurements II, (20 November 2003); https://doi.org/10.1117/12.506473

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