Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography

Marco Stampanoni; Gunther Borchert; Rafael Abela

doi:10.1117/12.503825

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23 December 2003 Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography

Marco Stampanoni, Gunther Borchert, Rafael Abela

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Proceedings Volume 5195, Crystals, Multilayers, and Other Synchrotron Optics; (2003) https://doi.org/10.1117/12.503825
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

With the advent of high brilliance, third generation synchrotron radiation sources, the spatial resolution of non-destructive X-ray tomographic investigations can be scaled down to the micrometer or even submicrometer range while the coherent nature of the radiation extends the traditional absorption imaging techniques towards edge-enhanced or phase-sensitive measurements. The performance of the presently used detectors is limited by scintillation properties, optical light coupling and charge coupled device granularity which impose a practical limit of about 1 micrometer spatial resolution with efficiencies of a few percent. We developed a detector called Bragg magnifier which exploits double asymmetrical Bragg diffraction from flat crystals to efficiently produce distortion- and aberrations-free X-ray images with magnification factors up to 150x150 and pixel sizes of less than 100x100nm².

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Marco Stampanoni, Gunther Borchert, and Rafael Abela "Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); https://doi.org/10.1117/12.503825

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