Detection of flaws and defects using lateral migration x-ray radiography

Edward T. Dugan; Alan M. Jacobs; Laurent Houssay; Dan Ekdahl

doi:10.1117/12.504361

30 December 2003 Detection of flaws and defects using lateral migration x-ray radiography

Edward T. Dugan, Alan M. Jacobs, Laurent Houssay, Dan Ekdahl

Proceedings Volume 5199, Penetrating Radiation Systems and Applications V; (2003) https://doi.org/10.1117/12.504361
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

A new Compton X-ray backscatter imaging (CBI) technique called lateral migration radiography (LMR) is applied to detecting a class of sub-surface defects in materials and structures of industrial importance. Examples are delamination in layered composite structures, defects in deposited coatings on metal surfaces such as in aircraft jet engine components and geometrical structural/composition changes (e.g. due to corrosion)on the inside of shell-like components with only outside surface area access. LMR scans on aircraft samples showed intensity decreases of up to 25% in corroded areas relative to intensities in clean areas. Especially significant were scans of samples that were performed with the clean or uncorroded side facing up. The corrosion on the opposite side of these 2 mm thick samples, where there was contact between the frame member and the aircraft skin, was clearly visible. Scans of other samples showed that LMR is capable of detecting small flaws on the inside of shell-like components with only outside surface area access. Cracks around a fastener hole that were ~ 15 mm in length and no more than 0.25 mm in width were seen through the aircraft skin. Scans of an aluminum honeycomb structure demonstrated that LMR is also capable of picking up internal defects that include crushed core and debonding zones.

Citation Download Citation

Edward T. Dugan, Alan M. Jacobs, Laurent Houssay, and Dan Ekdahl "Detection of flaws and defects using lateral migration x-ray radiography", Proc. SPIE 5199, Penetrating Radiation Systems and Applications V, (30 December 2003); https://doi.org/10.1117/12.504361

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