Detection of land mines using lateral migration backscatter x-ray radiography

Edward T. Dugan; Alan M. Jacobs; Zhong Su; Laurent Houssay; Dan Ekdahl

doi:10.1117/12.504364

30 December 2003 Detection of land mines using lateral migration backscatter x-ray radiography

Edward T. Dugan, Alan M. Jacobs, Zhong Su, Laurent Houssay, Dan Ekdahl

Proceedings Volume 5199, Penetrating Radiation Systems and Applications V; (2003) https://doi.org/10.1117/12.504364
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

An X-ray mine imaging system (XMIS) that uses a new form of backscatter x-ray radiography developed at the University of Florida was successfully field-tested at Fort A.P. Hill, Virginia in October, 2001. The XMIS obtained high quality images of both anti-tank and anti-personnel mines on several of the Fort A.P. Hill test lanes. For high resolution imaging at a power level of 750 watts, total time for scanning and for processed image acquisition was about 60 s for a 0.5 x 0.5 m area. The very good imaging results obtained from the initial field tests with the XMIS demonstrate the excellent capabilities of this system as a confirmation sensor for land mine detection. Critical to the success of the XMIS is the use of both collimated and uncollimated detectors. This yields system capabilities and performance that cannot be matched by using only uncollimated detectors with coded apertures and spatial filters to deconvolve system response. The initial field tests showed that some fairly simple modifications could significantly improve the performance of the XMIS. With the modifications, high resolution scanning of a 0.5 x 0.5 m area can be done in 20 to 30 seconds at a power level of around 300 watts.

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Edward T. Dugan, Alan M. Jacobs, Zhong Su, Laurent Houssay, and Dan Ekdahl "Detection of land mines using lateral migration backscatter x-ray radiography", Proc. SPIE 5199, Penetrating Radiation Systems and Applications V, (30 December 2003); https://doi.org/10.1117/12.504364

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KEYWORDS

Sensors

Mining

Image processing

Collimation

X-rays

Image sensors

Collimators

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