Direct-conversion x-ray imaging detector improvements and observations

Denny L. Y. Lee; Chuande Lui; Kelly P. Golden

doi:10.1117/12.509388

30 December 2003 Direct-conversion x-ray imaging detector improvements and observations

Denny L. Y. Lee, Chuande Lui, Kelly P. Golden

Proceedings Volume 5199, Penetrating Radiation Systems and Applications V; (2003) https://doi.org/10.1117/12.509388
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

DirectRay direct-conversion digital x-ray-imaging detectors using selenium exhibit high sensitivity and resolution to x-ray energies just below the K-fluorescence edge compared to energies just above. Detector sensitivity and self-protected dynamic range can be manipulated by modifying dielectric thickness and selenium electric field. Replacing the dielectric layer with a charge-transport layer (CTL) allows a faster cycle time, lower residual-image charge, improved signal to noise ratio, and better operating stability. The new CTL structure allows fast multi-frame imaging, enabling applications such as dual-energy subtraction, tomosynthesis, and dynamic imaging (fluoroscopy).

Citation Download Citation

Denny L. Y. Lee, Chuande Lui, and Kelly P. Golden "Direct-conversion x-ray imaging detector improvements and observations", Proc. SPIE 5199, Penetrating Radiation Systems and Applications V, (30 December 2003); https://doi.org/10.1117/12.509388

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