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2 February 2004 Infrared focal plane array readout integrated circuit with on-chip 14 b A/D converter
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Transferring the image information in analog form between the FPA and the external electronics causes the disturbance of the outside noise. On-chip A/D converter into the readout circuit (ROIC) can eliminate the possibilities of the cross-talk of noise. Also, the information can be transported more efficiently in power in the digital domain compared to the analog domain. In designing on-chip A/D converter for cooled type high density infrared detector array, the most stringent requirements are power dissipation, number of bits, die area and throughput. In this study, pipelined type A/D converter was adopted because it has high operation speed characteristics with medium power consumption. Capacitor averaging technique and digital error correction for high resolution was used to eliminate the error which is brought out from the device mismatch. The readout circuit was fabricated using 0.6μm CMOS process for 128 x 128 mid-wavelength infrared (MWIR) HgCdTe detector array. Fabricated circuit used direct injection type for input stage, and then S/N ratio could be maximized with increasing the integration capacitor. The measured performance of the 14 b A/D converter exhibited 0.2 LSB differential non-linearity (DNL) and 4LSB integral non-linearity (INL). A/D converter had a 1 MHz operation speed with 100mW power dissipation at 5V. It took the die area of 5.6 mm2. It showed the good performance that can apply for cooled type high density infrared detector array.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sang-Gu Kang, Doo Hyung Woo, and Hee Chul Lee "Infrared focal plane array readout integrated circuit with on-chip 14 b A/D converter", Proc. SPIE 5234, Sensors, Systems, and Next-Generation Satellites VII, (2 February 2004);


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