Thin film approach for pi achromatic phase shifters

Frederic Lemarquis; Pierre Riaud

doi:10.1117/12.513404

25 February 2004 Thin film approach for π achromatic phase shifters

Frederic Lemarquis, Pierre Riaud

Proceedings Volume 5250, Advances in Optical Thin Films; (2004) https://doi.org/10.1117/12.513404
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

Direct detection and characterization of Earth-like planets orbiting nearby stars are possible with nulling interferometry and coronagraphy in the thermal infrared. With these techniques, the star is extinguished by interference, with a ratio greater than 10⁵ to allow planet detection. Generally, these techniques require a π phase shifter. In this paper, we investigate how thin film coatings can be used to design π achromatic phase shifters. The design, which provides a π phase shift upon reflection, is basically formed with a high reflectance mirror and an antireflection structure that can be designed without any constraint on their own phase properties. The principle of the design is detailed and numerical examples illustrates this concept.

Citation Download Citation

Frederic Lemarquis and Pierre Riaud "Thin film approach for π achromatic phase shifters", Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); https://doi.org/10.1117/12.513404

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