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17 December 2003 Litho-and-mask concurrent approach to the critical issues for proximity electron lithography
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The performance of the LEEPL production tool is discussed from the framework of the litho-and-mask concurrent development schemes to establish the feasibility of proximity electron lithography (PEL) especially for contact and via layers in the 65-nm technology node. The critical-dimension (CD) uniformity of 4.7 nm has been achieved for 90-nm contact holes over the 1x stencil mask. Thus, the mask patterns can be transferred onto the resist layer with CD errors of less than 10%, even if the mask-error enhancement factor (MEEF) of 1.6 is taken into account. The mask manufacturability is improved if the MEEF further decreases via the use of thinner resists. Meanwhile, the overlay accuracy of 21.1 nm has been achieved in mix-and-match with the ArF scanner, with the intra-field error of only 5.1 nm owing to the real-time correction for the mask distortion. Also, the conditions for splitting dense lines into two complementary portions have been determined to avoid the pattern collapse in wet-cleaning and drying processes. The critical length of 2 mm is fairly safe for 70-nm lines if the low-damage drying is employed. The inspection tool based on transmission electron images cannot detect all printable defects without further optimization, hence a future challenge.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shinji Omori, Kazuya Iwase, Keiko Amai, Yoko Watanabe, Shoji Nohama, Shinichiro Nohdo, Shigeru Moriya, Tetsuya Kitagawa, Kenta Yotsui, Gaku Suzuki, and Akira Tamura "Litho-and-mask concurrent approach to the critical issues for proximity electron lithography", Proc. SPIE 5256, 23rd Annual BACUS Symposium on Photomask Technology, (17 December 2003);


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