The use of an optically trapped microprobe for scanning details of surface

Mojmir Sery; Petr Jakl; Jan Jezek; Alexandr Jonas; Pavel Zemanek; Miroslav Liska

doi:10.1117/12.545118

21 November 2003 The use of an optically trapped microprobe for scanning details of surface

Mojmir Sery, Petr Jakl, Jan Jezek, Alexandr Jonas, Pavel Zemanek, Miroslav Liska

Proceedings Volume 5259, 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics; (2003) https://doi.org/10.1117/12.545118
Event: 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of contemporary Optics, 2002, Krzyzowa, Poland

Abstract

We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.

Citation Download Citation

Mojmir Sery, Petr Jakl, Jan Jezek, Alexandr Jonas, Pavel Zemanek, and Miroslav Liska "The use of an optically trapped microprobe for scanning details of surface", Proc. SPIE 5259, 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, (21 November 2003); https://doi.org/10.1117/12.545118

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