Projection display metrology at NIST: measurements and diagnostics

Paul A Boynton; Edward F. Kelley; John M. Libert

doi:10.1117/12.527093

28 May 2004 Projection display metrology at NIST: measurements and diagnostics

Paul A Boynton, Edward F. Kelley, John M. Libert

Proceedings Volume 5289, Liquid Crystal Materials, Devices, and Applications X and Projection Displays X; (2004) https://doi.org/10.1117/12.527093
Event: Electronic Imaging 2004, 2004, San Jose, California, United States

Abstract

With the advent of digital cinema, medical imaging, and other applications, the need to properly characterize projection display systems has become increasingly more crucial. Several standards organizations have developed or are presently developing measurement procedures (including ANSI, IEC, ISO, VESA, and SMPTE). The National Institute of Standards and Technology (NIST) has played an important role by evaluating standards and procedures, developing diagnostics, and providing technical and editorial input, especially where unbiased technical expertise is needed to establish credibility and to investigate measurement problems.

Citation Download Citation

Paul A Boynton, Edward F. Kelley, and John M. Libert "Projection display metrology at NIST: measurements and diagnostics", Proc. SPIE 5289, Liquid Crystal Materials, Devices, and Applications X and Projection Displays X, (28 May 2004); https://doi.org/10.1117/12.527093

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