Paper
16 April 2004 An adaptive edge detection filter for light stripe projection (LSP) in surface reconstruction
Samuel H. Chang, Hongli Deng, Joe Fuller, Ali Farsaie, Les Elkins
Author Affiliations +
Proceedings Volume 5302, Three-Dimensional Image Capture and Applications VI; (2004) https://doi.org/10.1117/12.524532
Event: Electronic Imaging 2004, 2004, San Jose, California, United States
Abstract
The problem of using light stripe projection (LSP) for reconstructing the 3D surface of several objects positioned at different distances from the camera is addressed in this paper. It is shown using LSP for 3D surface reconstruction of objects at different depths can be significantly improved if adaptive edge detection filter is added. The filter is designed as a local dynamic hysteresis thresholding value generator. It adapts knowledge of the wavelet coefficients in a small neighborhood on the row profile and generates the local hysteresis threshold values to detect a meaningful and useful edge. It is then shown how the filter may be designed to recover missing LSP features by using common edge detection technique and how it increases the accuracy and reliability of 3D surface reconstruction. The adaptive edge detection filter is illustrated by the presentation of experimental results obtained using the methods described in the paper. A test outlines the differences between LSP edges detected with the adaptive edge detection filter and edges detected without the filter.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samuel H. Chang, Hongli Deng, Joe Fuller, Ali Farsaie, and Les Elkins "An adaptive edge detection filter for light stripe projection (LSP) in surface reconstruction", Proc. SPIE 5302, Three-Dimensional Image Capture and Applications VI, (16 April 2004); https://doi.org/10.1117/12.524532
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Edge detection

Digital filtering

Wavelets

Optical filters

Cameras

Image enhancement

3D metrology

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