Paper
16 April 2004 Real metrology by using depth map information
Edoardo Ardizzone, Sebastiano Battiato, Alessandro Capra, Salvatore Curti
Author Affiliations +
Proceedings Volume 5302, Three-Dimensional Image Capture and Applications VI; (2004) https://doi.org/10.1117/12.526596
Event: Electronic Imaging 2004, 2004, San Jose, California, United States
Abstract
Usually in an image no real information about the scene’s depth (in terms of absolute distance) is available. In this paper, a method that extracts real depth measures is developed. This approach starts considering a region located in the center of the depth map. This region can be positioned, interactively, in any part of the depth map in order to measure the real distance of every object inside the scene. The histogram local maxima of this region are determined. Among these values the biggest, that represents the gray-level of the most considerable object, is chosen. This gray-level is used in an exponential mapping function that converts, using the input camera settings, the depth map gray-levels into real measures. Experiments over a large dataset of images show good performances in terms of accuracy and reliability.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edoardo Ardizzone, Sebastiano Battiato, Alessandro Capra, and Salvatore Curti "Real metrology by using depth map information", Proc. SPIE 5302, Three-Dimensional Image Capture and Applications VI, (16 April 2004); https://doi.org/10.1117/12.526596
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KEYWORDS
Cameras

Distance measurement

Image processing

Metrology

3D image processing

Error analysis

Image restoration

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