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1 June 2004 Industrial-camera-based high-power YAG beam profiler
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Proceedings Volume 5333, Laser Resonators and Beam Control VII; (2004) https://doi.org/10.1117/12.524026
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States
Abstract
The increased use of high power Semiconductor lasers for industrial applications has created a demand for accurate, detailed beam profiling devices. Current technology, however, limits the use of conventional beam profiling instruments to about 1.5 kW. We will discuss a novel method of profiling high power YAG (1064 nm) industrial lasers up to 4kW in average power and 30 mm in raw beam diameter, using a camera-based, computer operated beam-profiling device. The new instrument is portable and employs conventional optics to attenuate and reduce the raw beam, and is designed to be used in an industrial environment.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lawrence I. Green "Industrial-camera-based high-power YAG beam profiler", Proc. SPIE 5333, Laser Resonators and Beam Control VII, (1 June 2004); https://doi.org/10.1117/12.524026
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