Diode array reliability experiment

David J. Gallant

doi:10.1117/12.537448

1 June 2004 Diode array reliability experiment

David J. Gallant

Proceedings Volume 5336, High-Power Diode Laser Technology and Applications II; (2004) https://doi.org/10.1117/12.537448
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States

Abstract

The reliability, long-term performance and lifetime of high power diode arrays are important issues for pumping of solid state and fiber laser systems. Operation of high power arrays in these systems has resulted in greater degradation rates than the reported lifetime data. We report on lifetime testing of a commercial high power array using an automated diode array reliability experiment. This computer controlled setup operates the laser array 24 hours a day in a cyclical format of 10 minutes on and one minute off. The array currently being tested was operated for more than 2500 hours at which time it experienced a sudden drop in power. Analysis of the array and the data suggest that the micro channel coolers corroded and that a sudden plugging of one or more channels caused the failure.

Citation Download Citation

David J. Gallant "Diode array reliability experiment", Proc. SPIE 5336, High-Power Diode Laser Technology and Applications II, (1 June 2004); https://doi.org/10.1117/12.537448

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available