Paper
12 May 2004 The effect of beam hardening on resolution in x-ray microtomography
Elke Van de Casteele, Dirk Van Dyck, Jan Sijbers, Erik Raman
Author Affiliations +
Abstract
Spatial resolution describes the ability to distinguish adjacent objects. It is often used as a measure of the quality of an image. By studying the edge of a cylindrical object a value for the spatial resolution is obtained. However, as a consequence of the polychromatic source used in micro-CT, beam hardening will occur which has the effect of enhancing the edges of the objects in the reconstruction images. These artefacts will have an influence on the resolution measure. In this paper, the spatial resolution in the reconstruction images is determined with and without beam hardening correction. In addition, the effect of the geometric magnification and the dependence on the type of sample material is studied.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elke Van de Casteele, Dirk Van Dyck, Jan Sijbers, and Erik Raman "The effect of beam hardening on resolution in x-ray microtomography", Proc. SPIE 5370, Medical Imaging 2004: Image Processing, (12 May 2004); https://doi.org/10.1117/12.535263
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Cited by 20 scholarly publications.
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KEYWORDS
Modulation transfer functions

Spatial resolution

Image resolution

Aluminum

Sensors

Point spread functions

Signal attenuation

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