Evaluation of interactive forces between alkaline earth metal fluoride particles and single crystal substrate using atomic force microscopy

Yi-Yang Tsai; Vijay Nalladega; Shamachary Sathish; Malcolm Keith Stanford

doi:10.1117/12.540987

21 July 2004 Evaluation of interactive forces between alkaline earth metal fluoride particles and single crystal substrate using atomic force microscopy

Yi-Yang Tsai, Vijay Nalladega, Shamachary Sathish, Malcolm Keith Stanford

Author Affiliations +

Proceedings Volume 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II; (2004) https://doi.org/10.1117/12.540987
Event: NDE for Health Monitoring and Diagnostics, 2004, San Diego, CA, United States

Abstract

Interactive forces between particles play an important role in diverse fields of science and technology. With the advent of Atomic Force Microscopy, investigation of interactive forces has been extended to micro and nano-scale particles with new applications. These forces are known to vary with the dimension of the particles and with the different levels of humidity. In the present paper we have investigated the interactive forces between a spherical particle probes of eutectic BaF₂-CaF₂ and a single crystal surface of CaF₂ using an Atomic Force Microscope. The effect of humidity on the interactive forces has been examined by analyzing the force-displacement curves at controlled levels of humidity. Force distance curves obtained with two different probes, 5 μm and 17 μm in diameter, and have been examined to investigate the effect of probe dimensions. The results are discussed in view of the application of eutectic BaF₂-CaF₂ particles in self-lubricating coatings for aerospace applications.

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Yi-Yang Tsai, Vijay Nalladega, Shamachary Sathish, and Malcolm Keith Stanford "Evaluation of interactive forces between alkaline earth metal fluoride particles and single crystal substrate using atomic force microscopy", Proc. SPIE 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II, (21 July 2004); https://doi.org/10.1117/12.540987

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KEYWORDS

Particles

Humidity

Adhesives

Spherical lenses

Atomic force microscopy

Crystals

Capillaries

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