System Characterization Using A Lateral Shearing Interferometer

Michael K. Giles; James L. Jernigan; Donald P. Murphy

doi:10.1117/12.976110

20 November 1985 System Characterization Using A Lateral Shearing Interferometer

Michael K. Giles, James L. Jernigan, Donald P. Murphy

Author Affiliations +

Proceedings Volume 0540, Southwest Conf on Optics '85; (1985) https://doi.org/10.1117/12.976110
Event: 1985 Albuquerque Conferences on Optics, 1985, Albuquerque, United States

Abstract

A lateral shearing interferometer similar to that described by Rimmer and WyantI was built and used to characterize an off-axis collimator/beam combiner system. Reduction of the interferogram data was accomplished by using an image processing system to digitize the fringe data convert the two orthogonal slope interferograms to a single wavefront interferogram, and then compute the system optical transfer function (nTP). The software was derived from a version of the FRINGE code (developed at the University of Arizona) modified to run on a VAX 11/780--DeAnza 1P8500 image processing system. The double crossed gratings (420 line pairs per millimeter) used to obtain orthogonal interferograms of the wavefront slope were produced using a technique based o Lloyd's mirror. This paper presents the technique used to produce the gratings, the configuration of the interferometer, and the results obtained (both interferometric and reduced OTF data).

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Michael K. Giles, James L. Jernigan, and Donald P. Murphy "System Characterization Using A Lateral Shearing Interferometer", Proc. SPIE 0540, Southwest Conf on Optics '85, (20 November 1985); https://doi.org/10.1117/12.976110

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