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20 April 2004 Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses
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Proceedings Volume 5402, International Workshop on Quantum Optics 2003; (2004) https://doi.org/10.1117/12.558810
Event: International Workshop on Quantum Optics 2003, 2003, St. Petersburg, Russian Federation
Abstract
It is shown that the high-resolution laser photoelectron microscope with subwavelength-spatial resolution can be used for an absolute values of the two-photon external photoelectric effect measurements with high (a few nm-scale) localization. The spatial distribution of light intensity in the near field is studied by observing the photoelectron projection images of a subwavelength nanoaperture. The imaging electrons are obtained as a result of two-photon external photoelectric effect induced in the aperture formed at the end of an optical fiber by femtosecond pulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser. The light-field distribution in the aperture is not distorted by any near-by object, which allows the first nonperturbing measurement of such a distribution.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey V. Chekalin, V. O. Kompanets, Vladilen S. Letokhov, Yu A. Matveets, B. N. Mironov, and S. K. Sekatskii "Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses", Proc. SPIE 5402, International Workshop on Quantum Optics 2003, (20 April 2004); https://doi.org/10.1117/12.558810
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