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12 April 2004 Improved sampling of thermal transients using focal plane array infrared imagers
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Abstract
Quantitative thermal diffusivity and thickness images can be obtained by minimizing the squared difference between the data and a thermal model. This requires the transient portion of the thermal response to be adequately sampled. For fixed infrared camera frame rates (typically 60 hertz) this may be difficult for very fast thermal transients. The focus of this work is to investigate a technique where the application of the flash heat is controlled by a variable delay. By cycling the flash heating and implementing a linearly increasing delay, thermal transients faster than the frame rate of the thermal camera can be successfully sampled. Detection of subsurface defects with improved defect contrast and spatial resolution on samples with fabricated defects is presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph N. Zalameda and William P. Winfree "Improved sampling of thermal transients using focal plane array infrared imagers", Proc. SPIE 5405, Thermosense XXVI, (12 April 2004); https://doi.org/10.1117/12.547453
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