Spectral quality requirements for effluent quantification

Richard N. Czerwinski; Kristine E. Farrar; Michael K. Griffin; John P. Kerekes

doi:10.1117/12.544011

12 August 2004 Spectral quality requirements for effluent quantification

Richard N. Czerwinski, Kristine E. Farrar, Michael K. Griffin, John P. Kerekes

Proceedings Volume 5425, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery X; (2004) https://doi.org/10.1117/12.544011
Event: Defense and Security, 2004, Orlando, Florida, United States

Abstract

Based on simulated atmospheric and sensor effects, we identify spectral resolution and per-channel signal-to-noise ratio (SNR) requirements for thermal infrared spectrometers that allow effluent quantification to any desired precision. This work is based on the use of MODTRAN-4 to explore the effects of temperature contrast and effluent concentration on the spectral slopes of particular absorption features. These slopes can be estimated from remotely sensed spectral data by use of least-squares techniques. The precision of these estimates is based on two factors related to spectral quality: the number of spectral samples that lie along an absorption feature and the radiometric accuracy of the samples themselves. The least-squares process also calculates the slope estimation error variance, which is related to the effluent quantification uncertainty by the same function that maps the slope itself to effluent quantity. The effluent quantification precision is thus shown to be a function of the spacing between spectral channels and the per-channel SNR. The relationship between SNR, channel spacing and effluent quantification precision is expressed as an equation defining a surface of constant "difficulty." This surface can be used to evaluate parameter sensitivities of sensors in design, to appropriately task sensors, or to evaluate effluent quantification tasks in terms of feasibility.

Citation Download Citation

Richard N. Czerwinski, Kristine E. Farrar, Michael K. Griffin, and John P. Kerekes "Spectral quality requirements for effluent quantification", Proc. SPIE 5425, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery X, (12 August 2004); https://doi.org/10.1117/12.544011

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available