Paper
10 September 2004 Measurement of the very thin metallic wires diameter for the industrial automatic control
Ibrahim Serroukh, J. C. Martinez, Angel Serrano, Eusebio Bernabeu
Author Affiliations +
Abstract
The accuracy and precision of the thin wires still requiring special attention. Both theoretical and experimental studies together may give closest approximation to the "real" value. Concerning the optical technique of measurement, perhaps one may analyze more in detail the interaction between light and matter (wire) which can lead to a simple mathematical approach. Besides this, a calibrating system and robust technique of measurement is required both in the industrial sector and laboratories. Measuring the wires depends especially on how much accuracy and precision we want to achieve, we have static or dynamic measurement, which kind of wire we need to measure...etc. This report shows some work about the diffraction models and some measurement of the thin wire (30-500 μm). Statistical technique of measurement is provided as well.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ibrahim Serroukh, J. C. Martinez, Angel Serrano, and Eusebio Bernabeu "Measurement of the very thin metallic wires diameter for the industrial automatic control", Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); https://doi.org/10.1117/12.545875
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KEYWORDS
Diffraction

Dielectric polarization

Calibration

Mathematical modeling

Mirrors

Reflection

Automatic control

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