A time-of-flight line sensor: development and application

Rolf Kaufmann; Michael Lehmann; Matthias Schweizer; Michael Richter; Peter Metzler; Graham Lang; Thierry Oggier; Nicolas Blanc; Peter Seitz; Gabriel Gruener; Urs Zbinden

doi:10.1117/12.545571

1 September 2004 A time-of-flight line sensor: development and application

Rolf Kaufmann, Michael Lehmann, Matthias Schweizer, Michael Richter, Peter Metzler, Graham Lang, Thierry Oggier, Nicolas Blanc, Peter Seitz, Gabriel Gruener, Urs Zbinden

Author Affiliations +

Proceedings Volume 5459, Optical Sensing; (2004) https://doi.org/10.1117/12.545571
Event: Photonics Europe, 2004, Strasbourg, France

Abstract

A new miniaturised 256 pixel silicon line sensor, which allows for the acquisition of depth-resolved images in real-time, is presented. It reliably and simultaneously delivers intensity data as well as distance information on the objects in the scene. The depth measurement is based on the time-of-flight (TOF) principle. The device allows the simultaneous measurement of the phase, offset and amplitude of a radio frequency modulated light field that is emitted by the system and reflected back by the camera surroundings, without requiring any mechanical scanning parts. The 3D line sensor will be used on a mobile robot platform to substitute the laser range scanners traditionally used for navigation in dynamic and/or unknown environments.

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Rolf Kaufmann, Michael Lehmann, Matthias Schweizer, Michael Richter, Peter Metzler, Graham Lang, Thierry Oggier, Nicolas Blanc, Peter Seitz, Gabriel Gruener, and Urs Zbinden "A time-of-flight line sensor: development and application", Proc. SPIE 5459, Optical Sensing, (1 September 2004); https://doi.org/10.1117/12.545571

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