Paper
4 June 2004 Structural changes of silicon crystals after high-energy electron irradiation
A. G. Gimchinsky, B. I. Gutsulyak, A. V. Oleynich-Lysyuk, N. D. Raransky, Z. Swiantek
Author Affiliations +
Proceedings Volume 5477, Sixth International Conference on Correlation Optics; (2004) https://doi.org/10.1117/12.559884
Event: Sixth International Conference on Correlation Optics, 2003, Chernivsti, Ukraine
Abstract
The secondary processes in monocrystalline Si before and after high-energy electron irradiation (about 18 MeV) and combined electron and gamma irradiation have been studied using the X-ray diffraction analysis and the method of internal friction in the infra-sound frequency range. It was shown that the irradiation influences on the degree of structural perfection of crystals and significantly deforms the infra-sound absorption spectrum and leads to an amplitude dependencies of the effective shear modulus (Gef) and to its temperature hysteresis. Presumptions about the nature of the observed phenomena were advanced.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. G. Gimchinsky, B. I. Gutsulyak, A. V. Oleynich-Lysyuk, N. D. Raransky, and Z. Swiantek "Structural changes of silicon crystals after high-energy electron irradiation", Proc. SPIE 5477, Sixth International Conference on Correlation Optics, (4 June 2004); https://doi.org/10.1117/12.559884
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Crystals

Silicon

X-ray diffraction

X-rays

Single crystal X-ray diffraction

Absorption

Crystallography

RELATED CONTENT

High-energy x-ray diffraction
Proceedings of SPIE (January 01 1991)
Crystal growth of LiYF4
Proceedings of SPIE (July 14 1997)
Water cooled first crystal as a solution for the high...
Proceedings of SPIE (December 11 1998)
X ray diffraction studies of the performance of Si TaSi2...
Proceedings of SPIE (December 11 1997)

Back to Top